An Xafs and Xeol Study on the Structure and Optical Properties of Cds/porous Silicon (cds/ps) Composite Nanostructure
نویسندگان
چکیده
Electrochemically deposited CdS nanoparticles (NPs) were formed using porous silicon (PS) as a substrate/electrode. The structure, electronic behavior of the CdS NPs and the interaction between CdS-PS were systematically examined using electron microscope, X-ray diffraction and X-ray absorption fine structure (XAFS) at S K-edge and Si K-edge. The optical luminescence behavior of the nanocomposite, CdS/PS, was also investigated with the technique of synchrotron X-ray excited optical luminescence (XEOL), which was proved to be a unique tool to distinguish the luminescence originated from both CdS and PS.
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